PVDF/PDDA静电自组装超薄膜的制备与表征

Preparation and Characterization of PVDF/PDDA Static Self-Assembly Ultrathin Film

  • 摘要: 提出了一种制备纳米量级铁电聚合物PVDF/PDDA超薄膜的新方法。聚二烯丙基二甲基氯化铵(PDDA)和极化处理后的聚偏氟乙烯(PVDF)复合超薄膜是通过层与层的静电自组装(LbL-SA)方法制备的,厚度约30~150 nm,每层膜厚度约为9 nm。PVDF/PDDA多层膜通过石英晶振微天平(QCM)、红外频谱仪、原子力显微镜(AFM)进行了测试与表征。QCM表征结果表明,PVDF与PDDA超薄膜能较好地交替组装;AFM表明PVDF/PDDA聚合物超薄膜的表面均匀、薄膜致密。与PVDF厚膜的电阻性能相比,PVDF/PDDA复合超薄膜的电阻性能有了很大提高。

     

    Abstract: A novel method for the production of nanoscale polymeric multilayer films of ferroelectric PVDF/PDDA is presented. The ultrathin multilayer film of poly (diallyldimethylammonium chloride) (PDDA) and polyvinylidene fluoride (PVDF) has been prepared by the layer-by-layer static self-assembly (LbL-SA) method. The PVDF/PDDA multilayer film with the thickness ranging from about 30nm to 150 nm (the thickness of each layer is about 9nm.) is characterized by quartz crystal microbalance (QCM), atomic force microscope (AFM), X-ray diffraction (XRD), and infrared spectra (IR). The QCM reveals that the alternate ultrathin films of PVDF and PDDA are well orderly assembled. AFM results indicate that PVDF/PDDA polymeric multilayer film with high uniformity has been obtained. Compared with PVDF thick film, resistivity of PVDF/PDDA ultrathin film is dramatically enhanced.

     

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