XPS谱在磁光介质可靠性分析中的应用
Application of XPS Spectra in Analysis of MO Medium Reliability
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摘要: 通过对单层结构和多层结构的磁光记录介质TbFeCo在常温环境气氛条件和高温加速应力条件下的可靠性对比实验,以及对组成元素的XPS光电子能谱分析,证明了只有经过多层结构保护处理的磁光记录介质才具有高的稳定性。Abstract: By contrastive experimental analyzing of the single layer film and multilayer film of magneto-optical recording medium TbFeCo in room and high temperature condition, it is proved that the magneto-optical medium has high stability by adopting multilayer film structure. the XPS analysis of element of TbFeCo also proves the conclusion.