高速SOI-LIGBT的数值分析

Numerical Analysis of High Speed SOI-LIGBT

  • 摘要: 研制出He离子注入局域寿命控制SOI横向绝缘栅双极晶体管(SOI-LIGBT),有效地提高了器件的关断速度,且与集成电路工艺相兼容。数值模拟表明,该器件的tf~VF折衷关系优于采用非局域寿命控制的器件,在相同关断速度下其正向压降可降低0.6~1.4 V,避免了阳极短路结构的正向快速返回现象。

     

    Abstract: He ion implantation localized lifetime control SOI lateral insulated gate bipolar transistor (SOI-LIGBT) is proposed in this paper,which can effectively raise the turn-off speed of devices,which is compatibles with integrated circuit process.It is demonstrated by numerical simulation that the tf~VF trade-off is superior to the devices using unlocalized lifetime control,the forward on-state voltage can be reduced by 0.6-1.4 V at the same turn-off speed,and it can avoid the snap-back phenomena of anode-short structure.

     

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