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[1]
|
LI Feng, WOO Peng-yung. Fault detection for linear analog IC the method of short-circuit admittance parameters[J]. IEEE Trans CAS I: Fundamental Theory and Applications, 2002, 49(1): 105-108. [2] 孙永奎. 基于支持向量机的模拟电路故障诊断方法研究[D]. 成都: 电子科技大学, 2009. SUN Yong-kui. Study on fault diagnosis in analog circuit based on support vector machine[D]. Chengdu: University of Electronic Science and Technology of China, 2009. [3] TAN Yang-hong, HE Yi-gang. A novel method for fault diagnosis of analog circuits based on WP and GPNN[J] International Journal of Electronics, 2008, 95(5): 431-439. [4] WANG Yan-bing, WANG Hong, MENG De-yong, et al. Oscillation-based diagnosis by using harmonics analysis on analog filters[C]//2014 International Symposium on VLSI Design, Automation and Test (VLSI-DAT). Hsinchu, Taiwan, China: [s.n.], 2014: 1-4. [5] HE Wu-ming, WANG Pei-liang. Analog circuit fault diagnosis based on RBF neural network optimized by PSO algorithm[C]//2010 International Conference on Intelligent Computation Technology and Automation. Changsha: [s.n.], 2010: 628-631. [6] LONG Bing, TIAN Shu-lin, WANG Hou-Jun. Diagnostics of filtered analog circuits with tolerance based on LS-SVM using frequency features[J]. Journal of Electronic Testing： Theory and Application, 2012, 28(3): 291-300. [7] HAN Han, WANG Hou-jun. A new method for analog circuit fault diagnosis based on testability and chaos particle swarm optimization[J]. J of Convergence Information Technology, 2012, 7(14): 444-453. [8] LIU Xiao-qin, WANG Da-zhi. Wavelet neural networks based fault diagnosis of analog circuit[C]//2012 24th Chinese Control and Decision Conference (CCDC). Taiyuan: [s.n.], 2012: 2234-2239. [9] WU Li-feng, ZHENG Xue-yan, GUAN Yong, et al. A survey of fault diagnosis technology for electronic circuit based on knowledge technology[C]//2013 25th Chinese Control and Decision Conference (CCDC). Guiyang: [s.n.], 2013: 3555-3559. [10] TAN Yang-hong, HE Yi-gang, CUI Cun, et al. A novel method for analog fault diagnosis based on neural networks and genetic algorithms[J]. IEEE Transaction on Instrumentation and Measurement, 2008, 57(11): 2631- 2639. [11] YANG Cheng-lin, TIAN Shu-lin, LONG Bing, et al. Methods of handling the tolerance and test-point selection problem for analog circuit fault diagnosis[J]. IEEE Transaction on Instrumentation and Measurement, 2011, 60(1): 176-185. [12] CANNAS B, FANNI A, MONTISCI A. Algebraic approach to ambiguity-group determination in nonlinear analog circuits[J]. IEEE Trans on Circuit and System, 2010, 57(2): 438-447. [13] 韩涵, 王厚军, 龙兵, 等. 基于改进马氏距离的模拟电路故障诊断方法[J].控制与决策[J]. 2013, 28(11): 1713- 1717. HAN Han, WANG Hou-jun, LONG Bing, et al. Method for analog circuit fault diagnosis based on improved Mahalanobis distance[J]. Control and Decision, 2013, 28(11): 1713-1717. |
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