Volume 35 Issue 6
Dec.  2017
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CHEN Guang-yu, HUANG Xi-zi, TANG Xiao-wo. Modular Solutions for Fault Tree Analysis of Reliability of Systems[J]. Journal of University of Electronic Science and Technology of China, 2006, 35(6): 989-992.
Citation: CHEN Guang-yu, HUANG Xi-zi, TANG Xiao-wo. Modular Solutions for Fault Tree Analysis of Reliability of Systems[J]. Journal of University of Electronic Science and Technology of China, 2006, 35(6): 989-992.

Modular Solutions for Fault Tree Analysis of Reliability of Systems

  • Received Date: 2004-06-21
  • Publish Date: 2006-12-15
  • Accounting for reliability analysis of computer systems with hardware and software, a dynamic and static Fault Tree model is presented to analyze reliability of systems. Analyzing reliability and components' importance of a sample of computer systems, this paper is focused on software reliability increment as the most crucial component for increasing system reliability effectively, and thus the importance of software reliability analysis and design is illustrated to increase the global reliability of systems distinctly.
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Modular Solutions for Fault Tree Analysis of Reliability of Systems

Abstract: Accounting for reliability analysis of computer systems with hardware and software, a dynamic and static Fault Tree model is presented to analyze reliability of systems. Analyzing reliability and components' importance of a sample of computer systems, this paper is focused on software reliability increment as the most crucial component for increasing system reliability effectively, and thus the importance of software reliability analysis and design is illustrated to increase the global reliability of systems distinctly.

CHEN Guang-yu, HUANG Xi-zi, TANG Xiao-wo. Modular Solutions for Fault Tree Analysis of Reliability of Systems[J]. Journal of University of Electronic Science and Technology of China, 2006, 35(6): 989-992.
Citation: CHEN Guang-yu, HUANG Xi-zi, TANG Xiao-wo. Modular Solutions for Fault Tree Analysis of Reliability of Systems[J]. Journal of University of Electronic Science and Technology of China, 2006, 35(6): 989-992.

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