Volume 35 Issue 3
Dec.  2017
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MA Zhi-xin, XU De-qi, DU Wei-jie. An Improvement on C&K Object-Oriented Software Metrics Suite[J]. Journal of University of Electronic Science and Technology of China, 2006, 35(3): 396-398.
Citation: MA Zhi-xin, XU De-qi, DU Wei-jie. An Improvement on C&K Object-Oriented Software Metrics Suite[J]. Journal of University of Electronic Science and Technology of China, 2006, 35(3): 396-398.

An Improvement on C&K Object-Oriented Software Metrics Suite

  • Received Date: 2003-12-02
  • Publish Date: 2006-06-15
  • Based on the study of object-oriented software measurement and the characteristics of object-oriented technology, some improvements on C&K metrics suite are discussed in this paper. Some new metrics for class size and class hierarchy measurement are presented including complexity per class, number of methods, depth of multi-inheritance tree and number of father etc. Meanwhile, the applications of these improved metrics in software engineering are discussed. All the improvements can supplement C&K metrics and optimize the result of measurement.
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    沈阳化工大学材料科学与工程学院 沈阳 110142

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An Improvement on C&K Object-Oriented Software Metrics Suite

Abstract: Based on the study of object-oriented software measurement and the characteristics of object-oriented technology, some improvements on C&K metrics suite are discussed in this paper. Some new metrics for class size and class hierarchy measurement are presented including complexity per class, number of methods, depth of multi-inheritance tree and number of father etc. Meanwhile, the applications of these improved metrics in software engineering are discussed. All the improvements can supplement C&K metrics and optimize the result of measurement.

MA Zhi-xin, XU De-qi, DU Wei-jie. An Improvement on C&K Object-Oriented Software Metrics Suite[J]. Journal of University of Electronic Science and Technology of China, 2006, 35(3): 396-398.
Citation: MA Zhi-xin, XU De-qi, DU Wei-jie. An Improvement on C&K Object-Oriented Software Metrics Suite[J]. Journal of University of Electronic Science and Technology of China, 2006, 35(3): 396-398.

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