Volume 36 Issue 4
Dec.  2017
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Article Navigation >  Journal of University of Electronic Science and Technology of China  > 2007  >  36(4): 657-659

ZHONG Zhi-yong, LIU Shuang, TANG Xiao-li, SHI Yu, ZHANG Huai-wu. An Optical Method of Contactless Measurement of Giant Magnetoresistance Effects in Magnetic Multi-Layer Films[J]. Journal of University of Electronic Science and Technology of China, 2007, 36(4): 657-659.
Citation: ZHONG Zhi-yong, LIU Shuang, TANG Xiao-li, SHI Yu, ZHANG Huai-wu. An Optical Method of Contactless Measurement of Giant Magnetoresistance Effects in Magnetic Multi-Layer Films[J]. Journal of University of Electronic Science and Technology of China, 2007, 36(4): 657-659.
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An Optical Method of Contactless Measurement of Giant Magnetoresistance Effects in Magnetic Multi-Layer Films

  • 1.

    State Key Laboratory of Electronic Thin Films and Integrated Devices,University of Electronic Science and Technology of China Chengdu 610054;

  • 2.

    School of Optoelectronic Information,University of Electronic Science and Technology of China Chengdu 610054

  • Received Date: 2005-05-07
  • Publish Date: 2006-08-15
  • The dependence of refractive index on spin asymmetrical coefficient was deduced based on self-averaging limit model in magnetic thin film materials with giant magnetoresistance effects and a measurement system using Fourier transform infrared spectroscopy was constructed to measure magnetorefractive effects (MRE). The measurement results of spin-valve multilayers Si/PtMn/CoFe/Ru/CoFe/Cu/Co/NiFe showed that MRE can be used to characterize GMR effect of magnetic thin films in infrared region.
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    沈阳化工大学材料科学与工程学院 沈阳 110142

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An Optical Method of Contactless Measurement of Giant Magnetoresistance Effects in Magnetic Multi-Layer Films

  • 1. State Key Laboratory of Electronic Thin Films and Integrated Devices,University of Electronic Science and Technology of China Chengdu 610054;
  • 2. School of Optoelectronic Information,University of Electronic Science and Technology of China Chengdu 610054
  • Received Date: 2005-05-07
  • Publish Date: 2006-08-15

Abstract: The dependence of refractive index on spin asymmetrical coefficient was deduced based on self-averaging limit model in magnetic thin film materials with giant magnetoresistance effects and a measurement system using Fourier transform infrared spectroscopy was constructed to measure magnetorefractive effects (MRE). The measurement results of spin-valve multilayers Si/PtMn/CoFe/Ru/CoFe/Cu/Co/NiFe showed that MRE can be used to characterize GMR effect of magnetic thin films in infrared region.

ZHONG Zhi-yong, LIU Shuang, TANG Xiao-li, SHI Yu, ZHANG Huai-wu. An Optical Method of Contactless Measurement of Giant Magnetoresistance Effects in Magnetic Multi-Layer Films[J]. Journal of University of Electronic Science and Technology of China, 2007, 36(4): 657-659.
Citation: ZHONG Zhi-yong, LIU Shuang, TANG Xiao-li, SHI Yu, ZHANG Huai-wu. An Optical Method of Contactless Measurement of Giant Magnetoresistance Effects in Magnetic Multi-Layer Films[J]. Journal of University of Electronic Science and Technology of China, 2007, 36(4): 657-659.
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