Volume 36 Issue 4
Dec.  2017
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ZHANG Jing. Application of XML Technology in Software Reliability Test[J]. Journal of University of Electronic Science and Technology of China, 2007, 36(4): 767-770.
Citation: ZHANG Jing. Application of XML Technology in Software Reliability Test[J]. Journal of University of Electronic Science and Technology of China, 2007, 36(4): 767-770.

Application of XML Technology in Software Reliability Test

  • Received Date: 2007-04-18
  • Publish Date: 2006-08-15
  • Software reliability test is an important way to assure the quality of the software. This paper presents XML test case module and a way to store test cases of software reliability test by using (Extensible Markup Language) XML technology. XML test case file creator and a test engine is implemented. The test case is read by the test driver program, which drives the tested program to run and compares the test result automatically. In this way, the software interface will be tested automatically and efficiently. Test data is divorced from test driver program for maintenance and reuse of the test data.
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    沈阳化工大学材料科学与工程学院 沈阳 110142

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Application of XML Technology in Software Reliability Test

Abstract: Software reliability test is an important way to assure the quality of the software. This paper presents XML test case module and a way to store test cases of software reliability test by using (Extensible Markup Language) XML technology. XML test case file creator and a test engine is implemented. The test case is read by the test driver program, which drives the tested program to run and compares the test result automatically. In this way, the software interface will be tested automatically and efficiently. Test data is divorced from test driver program for maintenance and reuse of the test data.

ZHANG Jing. Application of XML Technology in Software Reliability Test[J]. Journal of University of Electronic Science and Technology of China, 2007, 36(4): 767-770.
Citation: ZHANG Jing. Application of XML Technology in Software Reliability Test[J]. Journal of University of Electronic Science and Technology of China, 2007, 36(4): 767-770.

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