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Shi Yibing, Chen Guangju, Wang Houjun, Jiann S. Yuan. A Voltage-Comparator-Based Measuring Method of Substrate Noise[J]. Journal of University of Electronic Science and Technology of China, 2002, 31(1): 35-38.
Citation: Shi Yibing, Chen Guangju, Wang Houjun, Jiann S. Yuan. A Voltage-Comparator-Based Measuring Method of Substrate Noise[J]. Journal of University of Electronic Science and Technology of China, 2002, 31(1): 35-38.
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A Voltage-Comparator-Based Measuring Method of Substrate Noise

  • 1.

    College of Automation Engineering,UEST of China Chengdu 610054;

  • 2.

    College of Engineering and Computer Science,University of Central Florida,Orlando FL32816

  • Received Date: 2001-10-08
  • Publish Date: 2002-02-15
  • The measurement of substrate noise waveforms in mixed-signal integrated circuits is described in this paper.This method uses voltage comparators as on-chip noise detectors.From the influence of substrate noise on the comparator's state,the noise can be measured statistically.The substrate noise waveform can be reconstructed by using the measured results.The block diagram of a test system is designed.The formula of the equivalently sampled noise voltage and the test error are deduced. The experimental result through SPICE simulation is given based on the experimental circuits set up along with their substrate models.
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  • 1. 

    沈阳化工大学材料科学与工程学院 沈阳 110142

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A Voltage-Comparator-Based Measuring Method of Substrate Noise

  • 1. College of Automation Engineering,UEST of China Chengdu 610054;
  • 2. College of Engineering and Computer Science,University of Central Florida,Orlando FL32816
  • Received Date: 2001-10-08
  • Publish Date: 2002-02-15

Abstract: The measurement of substrate noise waveforms in mixed-signal integrated circuits is described in this paper.This method uses voltage comparators as on-chip noise detectors.From the influence of substrate noise on the comparator's state,the noise can be measured statistically.The substrate noise waveform can be reconstructed by using the measured results.The block diagram of a test system is designed.The formula of the equivalently sampled noise voltage and the test error are deduced. The experimental result through SPICE simulation is given based on the experimental circuits set up along with their substrate models.

Shi Yibing, Chen Guangju, Wang Houjun, Jiann S. Yuan. A Voltage-Comparator-Based Measuring Method of Substrate Noise[J]. Journal of University of Electronic Science and Technology of China, 2002, 31(1): 35-38.
Citation: Shi Yibing, Chen Guangju, Wang Houjun, Jiann S. Yuan. A Voltage-Comparator-Based Measuring Method of Substrate Noise[J]. Journal of University of Electronic Science and Technology of China, 2002, 31(1): 35-38.
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