Volume 29 Issue 2
Jan.  2018
Article Contents
Article Navigation >  Journal of University of Electronic Science and Technology of China  > 2000  >  29(2): 149-152

Liao Jinkun, Liu Renhou. LRL Calibration Method and Its Application to Microwave Measurem[J]. Journal of University of Electronic Science and Technology of China, 2000, 29(2): 149-152.
Citation: Liao Jinkun, Liu Renhou. LRL Calibration Method and Its Application to Microwave Measurem[J]. Journal of University of Electronic Science and Technology of China, 2000, 29(2): 149-152.
shu

LRL Calibration Method and Its Application to Microwave Measurem

  • 1.

    Dept. of Communication Engineering,Sichuan University Chengdu 610065;

  • 2.

    Microwave Measurement Center,UEST of China Chengdu 610054

  • Received Date: 1999-10-24
  • Publish Date: 2000-04-15
  • The problem of measurements for microwave devices is considered, and a physical model for LRL (Line-Reflect-Line) calibration method is described. The closed form expressions for devices under test are derived by means of microwave network theory and matrix techniques.The errors caused by the phase uncertainties of embedded parameters are deleted. In addition, LRL method can be used to de-embed the S parameters from the microwave transistor test fixture.
  • 加载中
通讯作者: 陈斌, bchen63@163.com
  • 1. 

    沈阳化工大学材料科学与工程学院 沈阳 110142

  1. 本站搜索
  2. 百度学术搜索
  3. 万方数据库搜索
  4. CNKI搜索
Get Citation
PDF
XML

Article Metrics

Article views(3533) PDF downloads(71) Cited by()

Related
Proportional views

LRL Calibration Method and Its Application to Microwave Measurem

  • 1. Dept. of Communication Engineering,Sichuan University Chengdu 610065;
  • 2. Microwave Measurement Center,UEST of China Chengdu 610054
  • Received Date: 1999-10-24
  • Publish Date: 2000-04-15

Abstract: The problem of measurements for microwave devices is considered, and a physical model for LRL (Line-Reflect-Line) calibration method is described. The closed form expressions for devices under test are derived by means of microwave network theory and matrix techniques.The errors caused by the phase uncertainties of embedded parameters are deleted. In addition, LRL method can be used to de-embed the S parameters from the microwave transistor test fixture.

Liao Jinkun, Liu Renhou. LRL Calibration Method and Its Application to Microwave Measurem[J]. Journal of University of Electronic Science and Technology of China, 2000, 29(2): 149-152.
Citation: Liao Jinkun, Liu Renhou. LRL Calibration Method and Its Application to Microwave Measurem[J]. Journal of University of Electronic Science and Technology of China, 2000, 29(2): 149-152.
shu

    HTML

Catalog

    Journal Online

    Author's Notes

    Links

    Copyright © 《电子科技大学学报》编辑部

    Address: Room 350, central building, University of Electronic Science and Technology, No.4, Section 2, Jianshe North Road, Chengdu Tel: 028-83202308,83207559 Email: xuebao@uestc.edu.cn

    本系统由 北京仁和汇智信息技术有限公司 开发 

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return