Abstract: A built-in self-test (BIST) scheme for analog to digital converters is proposed based on a linearramp signal and efficient output analysis. The proposed analysis method is an alternative to histogram-basedanalysis techniques to provide test time improvements, especially when the resources are scarce. In addition to themeasurement of DNL and INL, non-monotonic behavior can also be detected with the proposed technique. Twoimplementation options are presented based on how much on-chip resources are available. Experimental resultsdemonstrate the effectiveness of the proposed approach.