应用于不同类型FPGA的多模式调试系统
Multi-Mode Debugging System for VLSI Designs Using Different Types of FPGAs
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摘要: 随着超大规模集成电路(VLSI)以及片上系统(SoC)设计的日益复杂, 基于现场可编程门阵列(FPGA)的硬件仿效成为了必要环节. 为解决逻辑设计下载到基于FPGA的硬件仿效器后内部节点不可视的问题, 提出一种调试系统, 该调试系统使用了RTL级植入调试逻辑的调试方法, 统一的用户界面和软件侧底层接口, 并提供了ELA模式、Scan模式和Snapshot模式. 所有模式均使用统一的外部接口, 使得调试系统同时适用于Altera和Xilinx的FPGA. 实验结果表明, 与SignalTap和ChipScope模式相比, ELA模式消耗几乎相同的资源, 而Scan模式和Snapshot模式会消耗更少的FPGA资源.Abstract: Increasingly complicated very large scale integration (VLSI) design and system-on-chip (SoC) makes Field Programmable Gate Arrays (FPGA)-based emulation necessary. As a design is downloaded into a FPGA-based emulator, invisible internal nodes of the design pose a challenge for design debugging. To address the issue, a RTL-level runtime debugging system is proposed. The user can not only select sample signals, triggering signals and statements in RTL codes, but can change triggering mode or sample window runtime as well. The proposed debugging system supports three debugging modes including embedded logic analyzer (ELA) mode, scan mode and snapshot mode. All debugging modes use a unified external interface in order to make the debugging system suitable for both Altera and Xilinx FPGAs. Experiment results show that the ELA mode consumes nearly the same resources while the scan mode and snapshot mode consumes fewer resources, compared with SignalTap and ChipScope.