Abstract: The surface resistance Rs of a single piece of high Tc super-conductive thin film can be measured by a sapphire resonator with TE011+δ mode non-destructivity, at 77 K. By measuring the value of the resonator's quality factor, the microwave surface resistance Rs of testing sample can be also determined. A new measuring method is presented, and the surface resistance can be calculated. To measure Ô50.8mm high Tc super-conductive thin film, a special sapphire resonator working at 12GHz is made and used. The method has advantages of non-destructivity, single sample, high Q value, high sensitivity, convenient experiment setup, small volume, and flexibility in operation.