微波晶体管噪声参数CAT
Automated Noise Parameter Measurement for Microwave Transistor
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摘要: 介绍了一种测量微波晶体管噪声参数的方法,并用矢量网络分析仪和噪声系数测试仪组建了一套自动测试系统。在系统软件的控制下,该系统可对微波晶体管噪声参数进行快速、准确的测量;并给出了部分测试结果,还与厂家典型值进行了比较。Abstract: In thip paper,a method for determination of microwave transistor parameter is described.An automated measurement system for microwave transistor noise parameter is constructed using vector network analyzer and noise figure meter.With the control software,the system can do fast and accurate measurements.Some test results for GaAs FET are given and compared with typical data given by the manufacturer.