HU Wei, MU De-jun, HUANG Xing-li, TAI Yu. Crafting Verifiably Secure Architecture Through Gate Level Information Flow Analysis[J]. Journal of University of Electronic Science and Technology of China, 2015, 44(3): 428-432. DOI: 10.3969/j.issn.1001-0548.2015.03.019
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Citation:
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HU Wei, MU De-jun, HUANG Xing-li, TAI Yu. Crafting Verifiably Secure Architecture Through Gate Level Information Flow Analysis[J]. Journal of University of Electronic Science and Technology of China, 2015, 44(3): 428-432. DOI: 10.3969/j.issn.1001-0548.2015.03.019
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HU Wei, MU De-jun, HUANG Xing-li, TAI Yu. Crafting Verifiably Secure Architecture Through Gate Level Information Flow Analysis[J]. Journal of University of Electronic Science and Technology of China, 2015, 44(3): 428-432. DOI: 10.3969/j.issn.1001-0548.2015.03.019
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Citation:
|
HU Wei, MU De-jun, HUANG Xing-li, TAI Yu. Crafting Verifiably Secure Architecture Through Gate Level Information Flow Analysis[J]. Journal of University of Electronic Science and Technology of China, 2015, 44(3): 428-432. DOI: 10.3969/j.issn.1001-0548.2015.03.019
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