HAN Ji-guang, HE Cheng-wen, GUO Yong-huan, ZHANG Liang. SnAgCu-nano Al钎料Anand本构关系及焊点可靠性[J]. Journal of University of Electronic Science and Technology of China, 2015, 44(3): 471-474. DOI: 10.3969/j.issn.1001-0548.2015.03.027
Citation:
HAN Ji-guang, HE Cheng-wen, GUO Yong-huan, ZHANG Liang. SnAgCu-nano Al钎料Anand本构关系及焊点可靠性[J]. Journal of University of Electronic Science and Technology of China, 2015, 44(3): 471-474. DOI: 10.3969/j.issn.1001-0548.2015.03.027
HAN Ji-guang, HE Cheng-wen, GUO Yong-huan, ZHANG Liang. SnAgCu-nano Al钎料Anand本构关系及焊点可靠性[J]. Journal of University of Electronic Science and Technology of China, 2015, 44(3): 471-474. DOI: 10.3969/j.issn.1001-0548.2015.03.027
Citation:
HAN Ji-guang, HE Cheng-wen, GUO Yong-huan, ZHANG Liang. SnAgCu-nano Al钎料Anand本构关系及焊点可靠性[J]. Journal of University of Electronic Science and Technology of China, 2015, 44(3): 471-474. DOI: 10.3969/j.issn.1001-0548.2015.03.027