HAN Ji-guang, HE Cheng-wen, GUO Yong-huan, ZHANG Liang. SnAgCu-nano Al钎料Anand本构关系及焊点可靠性[J]. Journal of University of Electronic Science and Technology of China, 2015, 44(3): 471-474. DOI: 10.3969/j.issn.1001-0548.2015.03.027
Citation: HAN Ji-guang, HE Cheng-wen, GUO Yong-huan, ZHANG Liang. SnAgCu-nano Al钎料Anand本构关系及焊点可靠性[J]. Journal of University of Electronic Science and Technology of China, 2015, 44(3): 471-474. DOI: 10.3969/j.issn.1001-0548.2015.03.027

SnAgCu-nano Al钎料Anand本构关系及焊点可靠性

  • 研究了含纳米0.1 wt.%Al颗粒SnAgCu无铅钎料Anand本构关系,将本构关系应用于有限元模拟,分析FCBGA器件SnAgCu-nano Al焊点的应力-应变响应。结果表明,在不同的温度和应变速率的条件下,可以采用非线性数据拟合方法得到SnAgCu-nano Al钎料的Anand本构方程的9个参数值。结合Anand本构模型,采用有限元法计算焊点应力-应变,发现FCBGA器件SnAgCu-nano Al焊点应力-应变分布和焊点阵列有明显的关系,最大的应力-应变集中于拐角焊点;SnAgCu-nano Al焊点的应力-应变值明显低于SnAgCu焊点,证明纳米Al可以提高SnAgCu焊点的可靠性。
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