XIAO Hai-lin, REN Chan-chan, NIE Zai-ping, LI Min-zheng1Journal of University of Electronic Science and Technology of China, 2015, 44(5): 663-667. DOI: 10.3969/j.issn.1001-0548.2015.05.004
Citation:
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XIAO Hai-lin, REN Chan-chan, NIE Zai-ping, LI Min-zheng1Journal of University of Electronic Science and Technology of China, 2015, 44(5): 663-667. DOI: 10.3969/j.issn.1001-0548.2015.05.004
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XIAO Hai-lin, REN Chan-chan, NIE Zai-ping, LI Min-zheng1Journal of University of Electronic Science and Technology of China, 2015, 44(5): 663-667. DOI: 10.3969/j.issn.1001-0548.2015.05.004
Citation:
|
XIAO Hai-lin, REN Chan-chan, NIE Zai-ping, LI Min-zheng1Journal of University of Electronic Science and Technology of China, 2015, 44(5): 663-667. DOI: 10.3969/j.issn.1001-0548.2015.05.004
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