WANG Min, LI Wen-fang, ZHANG Guo-ge, WANG Xiao-jun, . Microstructure and Electrical Property of BaxSr1-xTiO3 Ferroelectric Thin Film Prepared by Microarc Oxidation[J]. Journal of University of Electronic Science and Technology of China, 2015, 44(5): 778-783. DOI: 10.3969/j.issn.1001-0548.2015.05.023
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Citation:
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WANG Min, LI Wen-fang, ZHANG Guo-ge, WANG Xiao-jun, . Microstructure and Electrical Property of BaxSr1-xTiO3 Ferroelectric Thin Film Prepared by Microarc Oxidation[J]. Journal of University of Electronic Science and Technology of China, 2015, 44(5): 778-783. DOI: 10.3969/j.issn.1001-0548.2015.05.023
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WANG Min, LI Wen-fang, ZHANG Guo-ge, WANG Xiao-jun, . Microstructure and Electrical Property of BaxSr1-xTiO3 Ferroelectric Thin Film Prepared by Microarc Oxidation[J]. Journal of University of Electronic Science and Technology of China, 2015, 44(5): 778-783. DOI: 10.3969/j.issn.1001-0548.2015.05.023
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Citation:
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WANG Min, LI Wen-fang, ZHANG Guo-ge, WANG Xiao-jun, . Microstructure and Electrical Property of BaxSr1-xTiO3 Ferroelectric Thin Film Prepared by Microarc Oxidation[J]. Journal of University of Electronic Science and Technology of China, 2015, 44(5): 778-783. DOI: 10.3969/j.issn.1001-0548.2015.05.023
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