Application of Multifractal Spectrum to Fault Diagnosis of Integrated Circuits Based on I_DDT

In this paper, the concept of multifractal spectrum and the computational method of wavelet maxima modulus of multifractal spectrum are firstly summarized. Then, a novel fault diagnosis algorithm for bridge faults and open faults of integrated circuits is presented based on the multifractal spectrum of transient power supply current (IDDT). The proposed method explores the multifractal spectrum for achieving characteristics of geometry structure of signals, and ultilizes the multifractal spectrum of IDDT for fault diagnosises of integrated circuits. Finally, simulation experiments with Hspice demostrate the effectiveness of the proposed algorithm.