Measurement of Complex Permittivity of Dielectric Materials at Microwave Frequencies

A new method of measuring the complex permittivity parameter is presented, and the expressions for solving electromagnetic parameters are obtained by using two scatter parameters, and the phase-shift ambiguity problem of thick samples is solved. The test system is established, and the method of calibration is discussed. Several dielectric samples are measured at X band. It is proved by the experiment that the presented method is valid.