Improvement of the Testing Method of Microwave Surface Resistance of High Tc Superconductive Thin Films

A kind of High Tc superconductive thin film microwave surface resistance test system around 12 GHz is described in this paper. The surface resistance of a single piece of high Tc superconductive thin film can be measured by a sapphire resonator with TE011+δ mode non-destructivity, at 77 K. By measuring the value of the resonator's quality factor, the surface resistance of testing sample can be also determined. And the influence of coupling device on calibrating physical model is also analyzed in this paper. Then testing accuracy of the system can be raised by improving coupling device. The test system is compared with former generations, and the testing accuracy is raised obviously.