YANG Jun-hua, SHANG Zhi-en, LU Feng. Fault Diagnosis of the Digital Logic Circuit Bast on Boolean Difference Calculus[J]. Journal of University of Electronic Science and Technology of China, 2005, 34(4): 517-520.
Citation:
YANG Jun-hua, SHANG Zhi-en, LU Feng. Fault Diagnosis of the Digital Logic Circuit Bast on Boolean Difference Calculus[J]. Journal of University of Electronic Science and Technology of China, 2005, 34(4): 517-520.
YANG Jun-hua, SHANG Zhi-en, LU Feng. Fault Diagnosis of the Digital Logic Circuit Bast on Boolean Difference Calculus[J]. Journal of University of Electronic Science and Technology of China, 2005, 34(4): 517-520.
Citation:
YANG Jun-hua, SHANG Zhi-en, LU Feng. Fault Diagnosis of the Digital Logic Circuit Bast on Boolean Difference Calculus[J]. Journal of University of Electronic Science and Technology of China, 2005, 34(4): 517-520.
Fault Diagnosis of the Digital Logic Circuit Bast on Boolean Difference Calculus
The applying of the large scale and super large scale integrate circuit in electronic systems gradually abroad. The research to the fault diagnosis design for testability of the digital system draws the technologist's fully attention. Multi-fault formula were given in this paper. The paper stresses the fault diagnosis and test set and design for testability by Boolean algebra method.
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