XIANG Yu, ZHANG Jun, WANG Wen-yong. A Test Case Generating Algorithm for Pairwise Testing[J]. Journal of University of Electronic Science and Technology of China, 2005, 34(6): 821-824.
Citation:
XIANG Yu, ZHANG Jun, WANG Wen-yong. A Test Case Generating Algorithm for Pairwise Testing[J]. Journal of University of Electronic Science and Technology of China, 2005, 34(6): 821-824.
XIANG Yu, ZHANG Jun, WANG Wen-yong. A Test Case Generating Algorithm for Pairwise Testing[J]. Journal of University of Electronic Science and Technology of China, 2005, 34(6): 821-824.
Citation:
XIANG Yu, ZHANG Jun, WANG Wen-yong. A Test Case Generating Algorithm for Pairwise Testing[J]. Journal of University of Electronic Science and Technology of China, 2005, 34(6): 821-824.
A Test Case Generating Algorithm for Pairwise Testing
Based on the research of black box testing of the embedded software, a new test case generation algorithm is proposed. This algorithm, based on the principles of pairwise testing, considers all possible values and their combinations on extern interfaces of a system. Experiments results show that this algorithm improves the efficiency of test case generation without any influence on the precision of software test.
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