LI Yun-fei, HUANG Ji-wei, ZHU Hong. Detection of Outliers from the Two-Parameter Exponential Distribution[J]. Journal of University of Electronic Science and Technology of China, 2005, 34(1): 127-130.
Citation:
LI Yun-fei, HUANG Ji-wei, ZHU Hong. Detection of Outliers from the Two-Parameter Exponential Distribution[J]. Journal of University of Electronic Science and Technology of China, 2005, 34(1): 127-130.
LI Yun-fei, HUANG Ji-wei, ZHU Hong. Detection of Outliers from the Two-Parameter Exponential Distribution[J]. Journal of University of Electronic Science and Technology of China, 2005, 34(1): 127-130.
Citation:
LI Yun-fei, HUANG Ji-wei, ZHU Hong. Detection of Outliers from the Two-Parameter Exponential Distribution[J]. Journal of University of Electronic Science and Technology of China, 2005, 34(1): 127-130.
Detection of Outliers from the Two-Parameter Exponential Distribution
In this paper, a method of examination for the upper outliers from the two-parameter exponential distribution is discussed. A new test statistic is given. We derive the accurate density function and the approximate distribution of this test statistic.
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