Zhang Lan, Xu Hongbing. A Novel Method for Fault Location Using Iddq[J]. Journal of University of Electronic Science and Technology of China, 2004, 33(2): 133-136.
Citation: Zhang Lan, Xu Hongbing. A Novel Method for Fault Location Using Iddq[J]. Journal of University of Electronic Science and Technology of China, 2004, 33(2): 133-136.

A Novel Method for Fault Location Using Iddq

  • A novel algorithm for fault location using Iddq has been presented in this paper. This algorithm is based on the information of the response of input vectors and the structure of the circuit. It could effectively locate the fault by simulating the DUT circuit under normal circumstance. A significant advantage of this method is that it could effectively locate multiple defects in a circuit. Experiment used to illuminate this algorithm is discussed in details.
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