Yang Chengtao, Zhang Ying, Li Yanrong. Application of XPS Spectra in Analysis of MO Medium ReliabilityJ. Journal of University of Electronic Science and Technology of China, 2001, 30(2): 129-133.
Citation:
Yang Chengtao, Zhang Ying, Li Yanrong. Application of XPS Spectra in Analysis of MO Medium ReliabilityJ. Journal of University of Electronic Science and Technology of China, 2001, 30(2): 129-133.
Yang Chengtao, Zhang Ying, Li Yanrong. Application of XPS Spectra in Analysis of MO Medium ReliabilityJ. Journal of University of Electronic Science and Technology of China, 2001, 30(2): 129-133.
Citation:
Yang Chengtao, Zhang Ying, Li Yanrong. Application of XPS Spectra in Analysis of MO Medium ReliabilityJ. Journal of University of Electronic Science and Technology of China, 2001, 30(2): 129-133.
Application of XPS Spectra in Analysis of MO Medium Reliability
By contrastive experimental analyzing of the single layer film and multilayer film of magneto-optical recording medium TbFeCo in room and high temperature condition, it is proved that the magneto-optical medium has high stability by adopting multilayer film structure. the XPS analysis of element of TbFeCo also proves the conclusion.
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