Zhang Shengcai, Shen Yunqin, Yao Suying. Degradation Causes and Life Estimation of Thermal Printing Heads[J]. Journal of University of Electronic Science and Technology of China, 2001, 30(2): 181-184.
Citation: Zhang Shengcai, Shen Yunqin, Yao Suying. Degradation Causes and Life Estimation of Thermal Printing Heads[J]. Journal of University of Electronic Science and Technology of China, 2001, 30(2): 181-184.

Degradation Causes and Life Estimation of Thermal Printing Heads

  • Long lifetime is a base for thermal printing heads to be applied widely. Experiments on these thermal printing heads include high temperature storage tests, shaking tests, pulse-heat tests, and actual thermal printing tests. From the experiments, five degradation modes of thermal printing heads are summarized. The degradation reasons for the five modes are analyzed and the means of increasing the lifetime of thermal printing heads are demonstrated.
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