A High-accuracy DFT Analysis Based on Synchronous Sampling Techniques
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Graphical Abstract
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Abstract
This paper presents a synchronous sampling technology to improve the accuracy of periodic signal DFT analysis. The theoretical support is analyzed in detail, and the hardware structure is introduced. As an example of application of this device, the results of the DFT analysis on a multi frequency signal are given, and the accuracy of these measurements is improved highly.
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