LRL Calibration Method and Its Application to Microwave Measurem

The problem of measurements for microwave devices is considered, and a physical model for LRL (Line-Reflect-Line) calibration method is described. The closed form expressions for devices under test are derived by means of microwave network theory and matrix techniques.The errors caused by the phase uncertainties of embedded parameters are deleted. In addition, LRL method can be used to de-embed the S parameters from the microwave transistor test fixture.