Wang Yong, Chen Guangiu. An Improved Genetic Algorithm for Delay-fault Test Generation[J]. Journal of University of Electronic Science and Technology of China, 1999, 28(2): 157-161.
Citation: Wang Yong, Chen Guangiu. An Improved Genetic Algorithm for Delay-fault Test Generation[J]. Journal of University of Electronic Science and Technology of China, 1999, 28(2): 157-161.

An Improved Genetic Algorithm for Delay-fault Test Generation

  • In this paper,the energy functions for hazard-free delay testing are presented, thus the problem of RRT (restricted robust test) generation for delay faults becomes an energy minimization problem. An improved genetic algorithm for RRT generation is given. This algorithm can inhibit premature convergence by modifying the population size with the degree of the evolution. The experiment shows that this method is effective.
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