Li Haitao, Yang Yapei, Deng Xingcheng. Research of Linewidth Measurement of Narrow Linewidth Semiconductor Laser[J]. Journal of University of Electronic Science and Technology of China, 1998, 27(5): 494-501.
Citation:
Li Haitao, Yang Yapei, Deng Xingcheng. Research of Linewidth Measurement of Narrow Linewidth Semiconductor Laser[J]. Journal of University of Electronic Science and Technology of China, 1998, 27(5): 494-501.
Li Haitao, Yang Yapei, Deng Xingcheng. Research of Linewidth Measurement of Narrow Linewidth Semiconductor Laser[J]. Journal of University of Electronic Science and Technology of China, 1998, 27(5): 494-501.
Citation:
Li Haitao, Yang Yapei, Deng Xingcheng. Research of Linewidth Measurement of Narrow Linewidth Semiconductor Laser[J]. Journal of University of Electronic Science and Technology of China, 1998, 27(5): 494-501.
Research of Linewidth Measurement of Narrow Linewidth Semiconductor Laser
By analyzing the delayed self-heterodyne method and investigating partial coherent theory, a novel technique delayed optical fiber interferometer is proposed This paper also deduces the formula describing the measurement of spectral linewidth of semiconductor laser width delayed optical fiber interferometer, which is demonstrated by simultaneous computation and experimental results.
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