Ruan Shichi. Analysis of Thin-film Pole Separation of SAW Element with EPMA[J]. Journal of University of Electronic Science and Technology of China, 1998, 27(6): 605-608.
Citation: Ruan Shichi. Analysis of Thin-film Pole Separation of SAW Element with EPMA[J]. Journal of University of Electronic Science and Technology of China, 1998, 27(6): 605-608.

Analysis of Thin-film Pole Separation of SAW Element with EPMA

  • Based on microarea topograph and microarea composition with EPMA, an series of Au/Cr/Bi12GeO20 SAW elements is micro-analyzed.It is proved that the thin-film pole separation appears in the boundary plane between Cr-film and Bi12GeO20-Substrate.This boundary connection is a simple weak adhesion and the Cr-film is forced intensely by a kind of internal-stress.As a result, the thin-film pole separates from the substrate.
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