Chen Chaoyang, Chen Guangju, Yu Juebang. A Test Generation System Based on Neural Networks[J]. Journal of University of Electronic Science and Technology of China, 1997, 26(1): 59-62.
Citation:
Chen Chaoyang, Chen Guangju, Yu Juebang. A Test Generation System Based on Neural Networks[J]. Journal of University of Electronic Science and Technology of China, 1997, 26(1): 59-62.
Chen Chaoyang, Chen Guangju, Yu Juebang. A Test Generation System Based on Neural Networks[J]. Journal of University of Electronic Science and Technology of China, 1997, 26(1): 59-62.
Citation:
Chen Chaoyang, Chen Guangju, Yu Juebang. A Test Generation System Based on Neural Networks[J]. Journal of University of Electronic Science and Technology of China, 1997, 26(1): 59-62.
During the past several years,a neural network approach for test generation problem in combinational circuits is investigated extensively.A test generation system based on combinational circuit's Hopfield neural network models is decribed in this paper.In the system,the probabilistic relaxation techniques are used to obtain the test vectors.Experimental results confirm the feasibility of this system.
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