Interpretations of Two dimensional Measurement Data Using Short Normal Device

In this paper,the distorted born iterative method(DBIM) is applied to deal with the inversion problem of the short normal device measurements in two-dimensional axisymmetric medium.In each iteration of the DBIM,an effiecient-half analytical half numerical method is used to solve the problem.This method provides a semianlytic expression for the Green's function and its derivatives required in the inversion,and then deduces a semianalytic expression of the integration in the nonlinear intergral equation.Therefore,the efficiency and accuracy are improved dramatically.