Chen Ling, Hou Luying. Automated Noise Parameter Measurement for Microwave Transistor[J]. Journal of University of Electronic Science and Technology of China, 1997, 26(4): 382-386.
Citation:
Chen Ling, Hou Luying. Automated Noise Parameter Measurement for Microwave Transistor[J]. Journal of University of Electronic Science and Technology of China, 1997, 26(4): 382-386.
Chen Ling, Hou Luying. Automated Noise Parameter Measurement for Microwave Transistor[J]. Journal of University of Electronic Science and Technology of China, 1997, 26(4): 382-386.
Citation:
Chen Ling, Hou Luying. Automated Noise Parameter Measurement for Microwave Transistor[J]. Journal of University of Electronic Science and Technology of China, 1997, 26(4): 382-386.
Automated Noise Parameter Measurement for Microwave Transistor
In thip paper,a method for determination of microwave transistor parameter is described.An automated measurement system for microwave transistor noise parameter is constructed using vector network analyzer and noise figure meter.With the control software,the system can do fast and accurate measurements.Some test results for GaAs FET are given and compared with typical data given by the manufacturer.
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