面向无损检测的近场30~40 GHz毫米波相位成像方法

Near-Field 30~40 GHz millimeter-wave phase imaging method for non-destructive testing

  • 摘要: 毫米波因其在近场具有较强的物体穿透能力和优异的空间分辨率,在航空航天高强度低密度隔热抗腐蚀吸波的复合材料无损检测领域引发了广泛的关注。主动反射式毫米波成像主要利用近场毫米波与物体的反散射效应来反演被测物体 毫米波与物体相互作用的相位效应。目前已有的近场毫米波成像方法主要利用毫米波能量衰减效应重构被测物体的图像,而该文将相位成像与近场毫米波成像相结合,利用毫米波与物体的相位效应进一步扩展面向无损检测的近场高精度成像方法。提出的近场毫米波相位成像方法首先利用基于球面波分解的近场二维合成孔径算法来反演被测物体反射率的相位主值数据,然后通过近场相位展开算法重构被测物体的高精度绝对相位图像。为了验证本方法的可行性,本文对金属遮蔽、材料夹层、聚四氟乙烯、石英陶瓷和氮化硅试块进行了实测,测试结果表明30~40 GHz毫米波近场相位成像方法可以有效检测半径为2 mm的缺陷。

     

    Abstract: Millimeter-wave imaging technology has garnered significant attention in the aerospace industry for non-destructive testing of composite materials that are high-strength, low-density, heat-insulating, corrosion-resistant, and wave-absorbing. This is due to its exceptional object penetration capability and high spatial resolution in the near field. The imaging technique known as active reflective millimeter-wave imaging primarily utilizes the backscattering effect of near-field millimeter waves and objects to generate a high-precision image of the object under test. The imaging technique demonstrates its characterization capability primarily in two aspects: the inversion amplitude reflects the energy attenuation effect of the interaction between millimeter waves and objects, while the inversion phase characterizes the phase effect of the interaction between millimeter waves and objects. Current methods for near-field millimeter-wave imaging primarily rely on the attenuation effect of millimeter-wave energy to reconstruct the image of the object under test. This paper proposes combining phase imaging with near-field millimeter-wave imaging to enhance the precision of near-field imaging for non-destructive testing by utilizing the millimeter-wave object phase effect. The method proposed for near-field millimeter-wave phase imaging involves using a near-field two-dimensional synthetic aperture algorithm based on spherical wave decomposition to invert the phase principal value data of the reflectivity of the object under test. This is followed by reconstructing the high-precision absolute phase image of the object under test using a near-field phase expansion algorithm. Real tests were conducted on various specimens, including a metal mask, material sandwich, PTFE, quartz ceramic, and silicon nitride, to assess the feasibility of this method. The results indicate that the millimeter-wave near-field phase imaging method operating at 30 GHz to 40 GHz can effectively detect defects with a radius of 2 mm.

     

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