双应力同步步降加速寿命试验方法

寇海霞, 安宗文, 刘波

寇海霞, 安宗文, 刘波. 双应力同步步降加速寿命试验方法[J]. 电子科技大学学报, 2016, 45(2): 316-320.
引用本文: 寇海霞, 安宗文, 刘波. 双应力同步步降加速寿命试验方法[J]. 电子科技大学学报, 2016, 45(2): 316-320.
KOU Hai-xia, AN Zong-wen, LIU Bo. Double Synchronous-Step-Down-Stress Accelerated Life Testing Method[J]. Journal of University of Electronic Science and Technology of China, 2016, 45(2): 316-320.
Citation: KOU Hai-xia, AN Zong-wen, LIU Bo. Double Synchronous-Step-Down-Stress Accelerated Life Testing Method[J]. Journal of University of Electronic Science and Technology of China, 2016, 45(2): 316-320.

双应力同步步降加速寿命试验方法

详细信息
  • 中图分类号: TP391.9

Double Synchronous-Step-Down-Stress Accelerated Life Testing Method

  • 摘要: 针对现有的双应力交叉步降加速寿命试验时间长、效率低的问题,提出一种双应力同步步降加速寿命试验方法。该试验方法将两加速应力以同步步降的方式逐级下降,使其形成一种斜坡式下降轨迹,从而提高试验效率,改善整个试验状态。并采用Monte Carlo方法,对寿命服从Weibull分布的产品进行双应力同步步降加速寿命试验仿真模拟。结果表明,该试验方法比双应力交叉步降加速寿命试验方法更能缩短试验时间,提高试验效率。
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出版历程
  • 刊出日期:  2016-04-14

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