VLSI功能测试的最佳测试序列的选取

Choice of Best Test Sequence for VLSI Functional Testing

摘要: 介绍了VLSI功能测试向量生成的Petri网模型和Petri网模拟测试序列中指令的关系,构造了压缩存储网络的拓扑信息的Petri网简约矩阵。用Petri网简约矩阵检查测试序列的不确定度,使测试序列不确定度最小,从而优化了测试序列,即从给定的指令中选出了最佳测试序列。

Abstract: This paper introduces Petri net model of functional test pattern generation for VLSI. Relationships between operators involved in test sequence are accomplished via Petri. Reduced matrix compacting storage of net topology is constructed. Ambiguity of test sequence is checked via Petri net matrix. Test pattern is optimized and the best test sequence is got.