测试图形生成的遗传算法研究

Study of Genetic Algorithm Method for Circuit Test Generation

  • 摘要: 提出了一种用于组合电路测试图形生成的遗传算法。该算法把被测电路的测试生成问题转化为计算一种约束函数的最优解,可充分利用电路的结构信息。为故障节点生成测试时易于操作,且无需经过故障模拟,就可保证对所有可测的单固定型故障及多故障有较高的故障覆盖率。

     

    Abstract: A new approach,genetic algorithm method for digital circuit automatic test patterns generation is presented in this paper,which defines a characteristic function for each basic gate circuit,converts the test generation problem of circuit under test(CUT) into searching for the optimal solutions of a constrained function,and can make use of the constructional information of CUT.It is possible to obtain high fault coverage for testable single stuck at and multiple faults with the method without fault simulation.

     

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