镜像法高温超导薄膜表面电阻测试装置的改进

Improvement of Image Method for Measuring the Microwave Surface Resistance of HTS Thin Film

  • 摘要: 介绍了一种新的镜像法高温超导薄膜微波表面电阻测试装置,采用小孔对谐振腔内的电磁能量进行耦合,并通过一段6 mm×3 mm×8 mm的填充氧化铍陶瓷介质的波导对电磁能量进行传输,通过在陶瓷块剖面焙银的方法实现磁耦合。与以往的镜像法测试装置相比,该装置易于仿真和制作。使用该装置对两片高温超导薄膜的微波表面电阻进行了测试,并对其中一片高温超导薄膜进行了6次微波表面电阻重复性测量,其表面电阻值RS (10 GHz, 77 K)的平均值为0.38 mΩ,标准偏差为0.009 mΩ,相对偏差(COV)为2.4%。测试结果表明,该装置具有良好的稳定性。

     

    Abstract: A new device using image sapphire resonator method is introduced for measuring the microwave resistance of high temperature superconductor (HTS) thin films. Coupling hole was used in this device for the stimulation of resonator. A 6 mm×3 mm×8 mm dielectric waveguide, an L type coupling loop made of roasting silver situating in the section plane of the dielectric waveguide are used for the EM transmitting. This coupling structure is a new attempt for low temperature measurement. The microwave surface resistances (RS) of two YBCO films about 2 inches deposited on MgO substrates are measured.

     

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