Abstract: A new method for testing the distribution of the microwave surface resistance (Rs) of high temperature superconductor (HTS) is introduced in this paper. By using the mirror method and its relevant principles, the energy convergence of dielectric resonator and cavity is achieved and the incompatible problem between the versatility and high resolution of Rs of HTS thin film is solved through a metal ring. A testing device working at 32 GHz with TE_012+δ mode is developed according to this method. The resolution of the device can reach a circle with 5 mm in diameter and 19.6 mm² in area. In this paper, the distribution test of Rs with thirteen points is conducted on a piece of two inch YBCO/LAO/YBCO superconductor thin film sample by this new testing device.